Scanning Electron Microscope

Scanning Electron Microscopy (SEM) is a sophisticated analytical instrument used for characterizing samples. With magnification capabilities up to 200,000X, SEM provides a means of imaging micro surfaces, particle size analysis, grain boundaries and much more.

Scanning Electron Microscopy (SEM) tasks will be performed utilizing a JEOL JSM 820 SEM coupled with a Tracor Northern TN5502 series II analyzer and Energy Dispersive Spectrometer (EDS). Quantitative analysis can be performed on samples with elements as light as sodium and qualitative results on samples with elements as light as boron. The SEM is equipped with Secondary Electron (SEI) and Backscattered Scattered Electron capabilities which make it possible to distinguish heavier elements from lighter ones enabling one to distinguish how they exist in a sample's structure; with images being captured on Polaroid prints and negatives. The TN5502 analyzer has capabilities of X-ray dot mapping, particle sizing and shape analysis and can be recorded to disk, 35mm prints, and 35mm slides with a Rembrandt Model 3500F Computer Graphics film recorder.