X-ray Fluorescence Analysis
The Institute has obtained the high performance XRF spectrophotometer EX310 from Jordan Valley AR, Inc. The EX310 can provide rapid, non-destructive multi-element determinations for elements from sodium (Na) to uranium (U) in a concentration range from ppm to high weight percentage. Samples for measurement can be in the form of solids, liquids, powders and thin films. The sample chamber can work under different atmospheres such as air, helium or vacuum depending on the sample requirements. X-ray methods involve the excitation of an atom by the removal of an electron from an inner energy level, usually the innermost K level of from one of the three L levels. Atoms can be excited by irradiation of the sample with x-rays of shorter wavelength than analyte elements. The XRF method rivals the accuracy of wet chemical techniques in the analysis of major constituents without destroying the samples. Jordan Valley XRF Copyright © 2000 Institute of Materials Processing (IMP) Michigan Technological University Michigan Technological University is an equal opportunity educational institution/equal opportunity employer. |